Quantify the most complex data using the most comprehensive atomic database incl. K, L, M and N lines
Largest solid angle for X-ray collection
Maximize your sample throughput with optimum geometry for most efficient collection of the generated X-rays
Energy-Dispersive Spectrometry for SEM, FIB-SEM and EPMA
Bruker's latest generation of QUANTAX EDS features the XFlash®7 detector series, which provides thelargest solid anglefor X-ray collection (also called collection angle) and thehighest throughput.
The XFlash®7 continues to set standards inperformance and functionalityin energy-dispersive spectrometry for the Scanning Electron Microscope (SEM), Focused Ion Beam (FIB-SEM) and Electron Probe Micro Analyzer (EPMA).
The XFlash®7 detector family also offers optimized solutions for EDS analysis of electron transparent specimens in TEM and SEM, as well as the unique XFlash®FlatQUAD, a detector made to answer your questions on challenging samples.
Slim-line technology, large collection angle design, latest generation pulse processing,maximized system uptimethrough predictive maintenance.
Highest spectral performanceobtained with best energy resolution.
Increased accuracy of resultsby sophisticated quantification algorithms and a unique combination of standardless and standard-based methods.