NPFLEX
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NPFLEX-1000
Le système de métrologie 3D NPFLEX offre la caractérisation de surface 3D sans contact la plus flexible pour des échantillons de grande taille tels que les implants médicaux orthopédiques et les grandes pièces des industries aérospatiale, automobile et d'usinage de précision. Il offre une densité de données, une résolution et une répétabilité supérieures à ce qui est possible avec l'instrumentation de contact, ce qui en fait une technologie complémentaire idéale ou une solution de métrologie autonome.
Caractéristiques
Optimized for Productivity Both in the Lab and on the Factory Floor
The NPFLEX-1000 delivers the most accurate and repeatable surface texture and roughness metrology for almost any precision manufacturing application.
The NPFLEX-1000 delivers a unique range of critical advantages:
- Ultimate large-part and high-slope surface compatibility reduces sample preparation and increases the range of measurement surfaces accessible per part;
- Exceptional ease-of-use empowers operators at any experience level to obtain expert results;
- Super-fast automated measurement and analysis routines provide decreased time-to-result; and
- Highly robust bridge architecture and integrated vibration isolation offer long-term accuracy and reliability for production environments.
Extreme Part Size and Shape Freedom
The NPFLEX-1000 delivers ultimate sample-size freedom and the unique ability to measure high-slope surfaces and difficult orientations on large parts thanks to Bruker's most innovative and exclusive technology, including:
- Large gantry and swivel head design:Provide unique access to difficult orientations on large parts;
- Long focal-length objectives:Expands the possibilities for sample types;
- Bore-Scope Objective:捕捉三维数据到150 mm内walls of cylinders or bores; and
- Fold-Mirror:提供内径的非破坏性分析s of bores and cylinders and along sidewalls of bowl shapes with high slopes up to 70°.
Customizable, Application-Specific Configurations
The NPFLEX-1000 system offers many options to customize its operation for specific applications.
Key features include:
- Open-access robust bridge architecture;
- Material-insensitive measurement;
- Allows custom fixtures and mounts (e.g., a vacuum wafer chuck or universal sample mounting kit); and
- For specialized applications, customized routines can be created specifically for your requirements.
Additional accessories further adapt the system to fit unique samples and applications.Contact usfor more information.
▲ CNC-milled part (p.7)
Flexibilité Métrologique Inégalée
NPFLEX est conçu spécifiquement pour étudier des échantillons de tailles et de formes très variées sans les endommager. Insensible au type de matériau, la technologie WLI du système fournit des mesures 3D sans contact de pratiquement toutes les caractéristiques de surface. Cette conception révolutionnaire à portique ouvert offre plus de 300 degrés d'accès à des surfaces auparavant inaccessibles ou trop difficiles à analyser en raison de leur taille ou de l'orientation des pièces. L'espace de 330 millimètres sous les objectifs permet d'accéder facilement aux zones de la pièce qui ne peuvent être atteintes avec d'autres types de profilomètres.
Configurations Personnalisées
Le système NPFLEX offre de nombreuses options permettant de personnaliser son fonctionnement pour des applications spécifiques. L'option de tête pivotante permet l'examen répétitif des parois latérales, des bords biseautés et des surfaces inclinées. Plusieurs options de platine sont disponibles :
- Platine rotative avec mandrin en option pour le maintien des dispositifs de fixation
- Platine rotative Thêta pour la rotation de l'échantillon
- Platine rotative Phi pour la rotation verticale de l'échantillon
- Platine à rouleaux Phi pour le positionnement et la rotation automatisés d'échantillons cylindriques plus petits.
- Platine XY automatisée pour le positionnement XY automatisé
Always Accurate and Repeatable
Whenever tight control of environmental factors is not possible, the NPFLEX-1000 still maintains excellent reproducibility thanks to its integrated vibration isolation and self-calibration. A built-in reference signal laser interferometer continuously calibrates the temperature to account for environmental influences and to always ensure high accuracy and reproducible measurements, ideal for applications that require absolute long-term stability.
Processus et Analyses Automatisés
NPFLEX est équipé du logiciel Vision64, l'interface graphique la plus fonctionnelle et la plus conviviale du secteur. Elle intègre les fonctionnalités familières du ruban et de la barre d'outils de Windows. Une architecture intelligente permet des capacités d'automatisation étendues définies par l'utilisateur. L'analyseur de données et la boîte à outils d'analyse de Vision64 intègrent des routines d'analyse spécifiques à l'industrie et aux normes ISO. Basée sur un flux de production manufacturier typique, l'interface fournit des outils permettant de personnaliser facilement les flux de processus et d'automatiser la cartographie.
Applications
Surface-Independent Metrology for Application-Specific Solutions
The flexibility of the NPFLEX-1000 is designed to answer the roughness and surface texture measurement questions that arise in precision machining QA/QC for sectors such as automotive, medical, and large-scale additive manufacturing. Some of these QA/QC studies include:
Accessoires
Logiciels
Bruker's Vision64® Instrument Control and Analysis
NPFLEX-1000 is powered by Vision64 software, the industry’s most functional and user-friendly graphical interface. This full-featured software includes:
Advanced Find Surface
The Advanced Find Surface feature enables any user to obtain quality results regardless of operator experience level, even in multi-user environments.
It not only enables auto-focus, but also adjusts key illumination parameters such as the intensity of the LED ring light. This allows uncompromised metrology on varied material surfaces with improved user experience, extreme operator ease, and faster time-to-result.
VisionXpress
Between the easy-to-use VisionXpress™ interface with its standard test library for multi-user environments, the award-winning full-featured Vision64 interface for advanced setup and automated analysis, and the Advanced Production interface for ultimate automation with minimal user intervention, you can select the most suitable solution for your unique metrology needs, without compromise. This unique capability enables uncompromised metrology on any surface, with increased throughput.
Universal Scanning Interferometry
The adaptive surface intelligence of USI mode automatically adjusts algorithm parameters for optimum results on different surface textures in the same field of view, even on surfaces with differing contrast, intensity, and heights. This ability to automatically sense the type of surface and provide the most accurate areal metrology makes it one of the easiest and most robust measurement methods for almost any surface, transparent to opaque, with a vertical range up to 120 µm.
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Support
How Can We Help?
Bruker partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.
Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.