The D8 DISCOVER Plus
XRD solution far more than you expected
Bright spot
D8 DISCOVER Plus is on the market the most powerful and most universal X-ray diffractometer.
Its core lies in the high precision ATLAS goniometer, it has high efficiency of Turbo X-ray source (TXS - HE) and market leading non coplanar arm.
It specially designed for the environmental conditions and environmental conditions, from the powder, amorphous and polycrystalline material to denotation multilayer film and other material designed for structural characterization.
Scope of application:
- Qualitative analysis and quantitative analysis, structure determination and refinement, analysis of micro strain and crystallite size
- X-ray reflection method, grazing incidence diffraction (GID), in-plane XRD diffraction, high resolution, GISAXS, GI stress analysis, crystal orientation analysis
- Residual stress analysis, texture and polar diagram, micro area, X-ray diffraction (XRD), wide Angle X-ray scattering (WAXS)
- Total scattering analysis: Bragg diffraction, the distribution function (PDF), small Angle X-ray scattering (SAXS)
The market situation
Automotive and aerospace
Semiconductor and microelectronics
The pharmaceutical industry screening
Energy storage/battery
drug
geology
metal
Thin film measurement
The characteristics of
The main function
Non coplanar arm
D8 DISCOVER Plus can be equipped with non coplanar arm, with unparalleled performance of in-plane diffraction measurements.
- 2 theta is up to 160 °, the determination of d spacing, zero and the accuracy of the match.
- Through the Angle encoder, unmatched precision can be achieved.
- Special optical path components, can increase strength measurement, you can even get signal ultra-thin polycrystalline thin films.
- But with DIFFRAC. SUITE software and DIFFRAC. DAVINCI seamless integration, so as to maximize efficiency.
The ATLAS ™ goniometer
In X-ray diffraction goniometer and precise orientation of installed components (especially) measurement is the basis of precision analysis of samples.ATLAS goniometer by design fully meet these requirements, and set the Angle and the spatial accuracy of benchmark:
- Solid and maintenance-free goniometer
- High precision stepper motor with high resolution optical encoder
- Accurate interface, by software to monitor for component installation
Measured the peak position of the peak position and certification as the angular deviation is delta 2 is 0.007 ° or less.This can be through the use of the individual instruments to NIST certified SRM1976 standard measurement to verify.
TXS - HE X-ray source
Regardless of the key indicators of X ray analysis tool is data quality (defined as SNR or signal-to-noise ratio - background) or sample throughput, more signal is always a big advantage.
Efficient Turbo X-ray source (TXS - HE) aims to enhance the signal at the same time, minimize the anode rotary technology related maintenance.
- The intensity of industrial sealing tube is five times
- Focus: the focus of the incomparable brightness, namely 6 kW/mm2
- With the ideal combination of optics, can achieve maximum intensity
- Reduce the optical path length, thus minimizing air scattering
The ATLAS ™ goniometer
Have I mu S micro JiaoYuan MONTEL optical device
Compact ucm Plus 150
PATHFINDER Plus optical device
EIGER2 R 500 k
MONTEL Plus with special optical device
application
Senior breakthrough diffraction
Thin film analysis
Coplanar diffraction
In coplanar experiments, gamma ray source and detector relative to the Angle on the surface of the samples increased, so the detection Angle into the surface of the sample.
- Grazing incidence diffraction (GID) : phase sensitive surface identification and determination of structural properties, including the crystallite size and strain.
- X-ray reflection method (XRR) : used to extract from the simple to the highly complicated superlattice layers of sample thickness, material density and interface structure information.
- Grazing incidence small Angle X-ray scattering (GISAXS)
Non coplanar diffraction
In non coplanar experiments, gamma ray source and detector relative to the Angle on the surface of the sample is fixed, the detector with parallel to the direction of the sample surface, thus detecting direction is along the surface of the sample.
- Grazing incidence within plane diffraction (IPGID) : can be reduced the penetration depth to nm, so as to realize the surface segregation and improve the atom thick layer of sensitive detection.
- In polycrystalline IPGID can determine surface grain size
- Epitaxial IPGID can directly measure in-plane lattice parameters and the orientation.
Materials research
ATLAS goniometer improved the precision of analysis point of view and the actual space positioning accuracy, realized with the macro micro area measurement of the sample.By MONTEL with the symmetrical divergence (including I SPlusAnd multimodal EIGER2 R series detector used in combination, can achieve a new class of diffraction, can achieve the similar to the beam line beam quality and detecting ability.
- Grazing incidence diffraction (GID) : phase sensitive surface identification and determination of structural properties, including the crystallite size and strain
- X-ray reflectivity measurement (XRR) : used to extract from the simple to the highly complicated superlattice layers of sample thickness, material density and interface structure information.
- High resolution X ray diffraction (HRXRD) : for: analysis of epitaxial layer thickness, strain, relaxation, Mosaic, mixed crystal composition analysis.
- The stress and the analysis of texture (preferred orientation)
- Wide Angle X-ray scattering (WAXS)
Powder diffraction
Powder diffraction (XRPD) covers a large number of orientation degree lower sample application.Through the ATLAS goniometer, D8 will DISCOVER Plus XRPD precision to a new level.Because of the accuracy beyond industry-leading D8 goniometer, the analyst can through to the D8 DISCOVER Plus, reveal the unseen, the structure of the small details.And equipped with TXS - HE, it can make the D8 DISCOVER Plus data collected XRPD faster: traditional X-ray tube, closed system is five times.
And combined with powerful DIFFRAC. SUITE software, you will be able to easily use the D8 DISCOVER PXRD Plus processing application:
- Qualitative phase analysis
- Quantitative analysis of
- Structure of the solution
- Analyzing the distribution function (PDF)
- Small Angle X-ray scattering (SAXS)
Range of application
The residual stress analysis
Using the 2 d detector (including XRD
The environment of XRD
Small Angle X-ray scattering (SAXS)
Wide Angle X-ray scattering (WAXS)
Texture analysis
Reciprocal space scanning
X-ray reflectivity measurement (XRR)
High resolution X ray diffraction (HRXRD)
The chip and scans the area
Reciprocal space scanning
Technical parameters
The D8 DISCOVER Plus specifications
| specifications | advantage | |
| TWIST - TUBE | Easily switch between focus point and line focus Anode material available: Cr, Cu, Mo, Ag The highest power and filament: 3 kW, depends on the anode material (0.4 x 16 mm squared) Patents: EP 1 923 900 B1 |
Rapidly changing wavelength to ideal to match different applications Can quickly switch between online focus and focus point, thus expanded the application scope, and can be in a shorter period of time, get better results. |
| I (including micro JiaoYuan s | The highest power load: 50 W, single phase power MONTEL and MONTEL Plus optics: combines the parallel lens and focus lens Beam size: as low as 180 x 180 (including m squared Mirror export biggest fluence: 8 x 10 ⁸ CPS Low beam divergence: 0.5 mrad |
Mm the size of the beam, high brightness and low background Green design: low power consumption, water consumption, longer service life To optimize the shape and divergence, to achieve the best results |
| TXS - HE X-ray source | Vertical ATLAS goniometer is compact and lightweight design Line focus, 0.3 x3mm squared Focal spot brightness is 6 kW/mm squared Anode materials: Cu, Co, Cr, Mo The highest maximum voltage 50 kV power depends on the anode material: Cr 3.2 kW, 5.4 kW, Cu/Mo Co 2, 8 kW Advance on tungsten filament |
High flux X-ray source, permissible level install the samples. Strength is 5 times of the standard ceramic X-ray source Is the line focus and the focal point of point application of ideal Preliminary alignment of the filament to support rapid change, greatly reduced the demand for at. |
| For any partial or called | Software switch button: Electric divergence slit (Bragg - Brentano) High strength Ka1, two parallel beam High resolution Ka1 parallel beam Patents: US10429326, US6665372, US7983389 |
Can be in as many as six different automatic electric switch between beam geometry, without human intervention Is ideal for all types of samples, including powder, block material, fiber, sheet and film (amorphous, polycrystalline and extension) |
| High resolution monochromator | Symmetry in geometry and asymmetric geometry Ge Ge (004) (220) and reflection 2 - b and 4 - (Bartels type b) monochromator Use the SNAP LOCK technology, aim to avoid the installation |
In terms of optimum resolution and strength balance, provide wide selection for you, help you to get the best results Can be replaced rapidly monochromator, optimized for different samples |
| The ATLAS ™ goniometer | Mechanical design of the vertical goniometer, the reinforced, TXS is oriented - HE X-ray source : the perspective of industry leading precision in NIST SRM 1976 to determine the Angle range, guarantee + / - 0.007 ° 2 theta Seamless integration D8 series components: including optics, camera positioning, samples, the environment and detector technology |
Brooke unique collimating that offers unparalleled accuracy assurance Absolutely free maintenance drive/gear, lubrication for life Support all applications, to generate the highest accuracy of data |
| Non coplanar arm | The third goniometer shaft, used to study the thin layer and the sample features: Minimum step length: 0.001 ° Top 2 theta range (depending on the configuration) : 160 ° Detector automatic distance detection |
Through the Angle encoder, can achieve unparalleled accuracy Seamless integration with the DIFFRAC. SUITE software Range as high as 160 ° 2 theta, can be the most accurate determination of non coplanar structure EIGER2 detector provides real-time calibration |
| Compact ucm sample sets | Compact ucm Plus 80: Fast rotator XRPD (x, y) largest mobile: + / - 40 mm The highest sample height: 57 mm Compact ucm Plus 150: The highest (x, y) mobile: + / - 75 mm The highest sample height: 57 mm Used for silicon wafer clamp and tilting table vacuum and electric power hole |
Available in thin film research and seamless switching between powder diffraction patterns Five sampler: samples of 51 mm diameter Nine automatic sampler: samples is 32 mm diameter Scan 2-4 inch wafer Scan 6-8 inch wafer Reflection mode: 96 - well plates The connection is tilted under the condition of sample set and vacuum sample set, is not restricted to Phi rotation, without considering cable or vacuum line. |
| Centric Eulerian Cradle (CEC) | Sample machine: five degrees of freedom X, y: + / - 40 mm samples Z: highly aligned Phi: 360 ° rotation Psi: - 11 ° to 98 ° The highest load weight: 1 kg Provide all kinds of sample machine accessories |
When lateral tilt, the measurement of stress and texture, in order to get higher accuracy. (x, y) : automatic mapping function. Surface of electric tilting table: perfect alignment. Powder or capillary rotator: can be used for powder diffraction. Bayonette sample machine: support can be rapid and repeatable swaps with other sample. |
| Pathfinder Plus called | Software switch button: Electric slit 2 - b Ge analysis crystal Integrated automatic absorber |
Can be automatic between two different optical device on the electric switch, without human intervention. Keep the LYNXEYE detector full field of vision. Use of absorber, ensures that the linear measurement data. |
| LYNXEYE XE - T | Energy resolution: 8 KeV, < 380 eV Test mode: 0 d, 1 d and 2 d Wavelength: Cr, Co, Cu, Mo and Ag Patents: EP1647840, EP1510811, US20200033275 |
Don't need to decide K filters and secondary monochromator Iron radiation can be 100% filter fluorescence 450 times faster than conventional detector system Bragg2D: use the divergence of the primary data collected 2 d wiring harness Unique detector warranty: no bad delivery channels |
| EIGER2 | Dectris ltd. developed based on mixed photon counting technology of a new generation of detectors, support for multiple model (0 d / 1 d / 2 d). | In continuous scanning and advanced scanning mode of step-by-step scanning, seamless integration 0 d, 1 d and 2 d test. Ergonomic from probe rotating function, can optimize the gamma or 2 Ɵ Angle range Use full detector, free tools panoramic view of the diffraction beam optical systems Continuous variable detector position to balance the Angle range and resolution |
| The environment | Temperature: the range from 4 K ~ to ~ 2500 K Pressure: 10 - ⁴ mbar to 100 bar Humidity: 5% to 95% |
Under the condition of the environment and the environment in the investigation Sample units with DIFFRAC. DAVINCI, easily replaced |
accessories
XRD components
Bruker XRD solution contains a series of high-performance components to meet the demand of analysis.Modular design is the key to make the best instrument.
All kinds of components are brooke component part of the core competitiveness, they are made from brooke AXS development or, or by close cooperation with the third party suppliers.
Brooke XRD components can be used to upgrade the existing X-ray system, is used to improve its performance.
software
webinar
For more information
The D8 DISCOVER Plus resources
Product manuals and flyers
- The D8 DISCOVER XRD solutions for industrial and research
- Applicable to vertical goniometer D8: lay a solid foundation
- Applicable to the D8 DISCOVER sample stage: multi-function sample processing
- The D8 DISCOVER Plus: ATLAS ™ goniometer and efficient Turbo X-ray source
- The Universal Motion Concept and Eulerian Cradles: control samples
Application report and webinars
- Use grazing incidence diffraction geometry characterization of thin metal film
- The D8 DISCOVER Plus: PDF analysis of titanium dioxide nanoparticles
- D8 DISCOVER Plus: inhaled silica lower limit of detection limit (LOD) and quantitative (LOQ)
- The D8 DISCOVER Plus: film and superlattice X-ray reflection method
support
Service and support
We offer:
- Professional senior technical personnel to do fault professional technical support, isolation and solve the problem of hardware and software
- Network remote service, providing diagnosis and application support
- Fusion reality support - virtual engineers in your side,video)
- According to your request to schedule maintenance
- Customer site maintenance, maintenance services
- Spare parts delivery will be within one working day/the world needs a few working days to complete
- Installation qualification and operational qualification/performance verification of compliance services
- Site planning and relocation
- Find nextA training course
Check out ourSupport site:
- Software updates
- Product manuals and installation guide
- Training video
Need to register.
