XFlash 6 to 30

XFlash^®6-30 combines excellent energy resolution and 30 mm²The larger solid Angle of chip area.That makes this product can cover all EDS application, from the lighter elements analysis to rapid acquisition and EDS and EBSD synchronous measurement.XFlash^®6-30 will provide fast results.

To sum up, XFlash^®6-30 has the following advantages:

• XFlash^®6-30 excellent energy resolution (Mn K alpha is 123 eV, alpha to 45 C K eV, F K alpha for 53 eV)
• Other available resolution of 126 eV and 129 eV (alpha) Mn K
• High pulse load capacity
• Excellent light and low energy detection performance (Be - Am element range),
• Simple, no vibration design of cooling system
• Immediately after open the power supply is available
• Low running cost
• Maintenance free operation
• Small size, including the fine diameter technology
• Light weight

XFlash^®6-30 suggested applications include:

• Used for SEM and electronic probe, FIB - SEM EDS system (welding corrugated pipe can be used as an option)
• The EDS and fast EBSD analysis eFlash FS probe
• Rapid element surface analysis