AFM application mode

Peak force KPFM

Good spatial resolution and no false potential contrast

PeakForce KPFM ™ offers the highest spatial resolution and the most accurate surface potential measurement, so as to improve the measurement performance, instead of the traditional KPFM technology.Through the new PeakForce tappingMode,Scanning algorithm and brooke unique internal ®Development, these improvements have been implemented.

Unique is that PeakForce KPFM provides the most accurate probe to the probe surface potential measurement, achieve consistent measurement of different material types.It can be withPeakForce tappingQNM ®Used together, on various sample at the same time to provide highly relevant nanoscale topography mapping, electrical and mechanical properties.PeakForce KPFM also by adopting ScanAsyst ® mode operation, to overcome the traditional KPFM technology important usabilityThe problem,Make all experience level users are able to obtain an expert data.

Peak power KPFM offer:

  • The most accurate and repeatable and the most sensitive work function measurement
  • The spatial resolution of the leading combined with no artifact potential contrast
  • Related quantitative nano mechanical properties map
PeakForce KPFM (lower) in a dark and light, the intensity is equivalent to 300 SUNS (upper part) of the ITO substrate MDMO - PCBM bulk heterogeneous potential map of solar cells.(sample provided by the university of mons, Dr Philip le koehler)