TappingMode
One of the hottest AFM imaging mode, the cornerstone of professional technology
TappingMode ™ enables researchers to cannot afford to contact imaging model of transverse force weak samples, and can achieve far in excess of the non-contact mode of rapid scanning speed.
TappingMode AFM is brook a patent technique, by using the vibration probe tip tapping surface topography imaging.The oscillation amplitude of the beam with the sample surface morphology change, through monitoring the changes and changes in z feedback loop will maintain at a minimum, morphology image is achieved.
This popular AFM model is the basis of many advanced mode, such asElectrostatic force microscopy (EFM) and magnetic force microscope (MFM).
The morphology of antimony dendrite in the graphite surface.
