Dimension (atomic force microscope
Bright spot
Dimension (atomic force microscope
Bruker Dimension ® Icon ™ atomic force microscope for the researchers in the field of industry and research community nano brought a brand-new application experience, has a high level of performance, functionality and accessories selection, its test powerful, simple operation and easy.Decades of technical experience gathered Dimension system, the masses of customer feedback, combined with the equipment in the field of industrial demand, Dimension Icon has carried on the comprehensive innovation.A new system design, has realized the unprecedented low drift and low noise level.Now, the user need only a few minutes to get accurate scan of the image.
The characteristics of
High performance and high resolution
Dimension ® Icon ™ excellent resolution, combined with Bruker unique electronic scanning algorithm, significantly improve the measurement speed and quality.Dimension ® Icon ™ is the latest innovation, pinpoint scanning technology has been in a leading position.The temperature compensation system configuration position sensor, realized the Z axis and ella, and XY stage of low noise levels, applied the performance in 90 microns scan range, large sample system, effect is even greater than that of high resolution atomic force microscope open loop noise levels.XYZ closed-loop scanning head of the new design of the instrument at higher scanning speed, image quality will not be damaged, implements the data collection of larger output.Configuration of Bruker patent PeakForce ® technology, Dimension Icon can realize intelligent to obtain high resolution images.
excellence
Dimension IconAtomic force microscopeHas become a research area is one of the most popular type atomic force microscope, use the Dimension (the number of published articles is far more than other big sample equaled.Dimension Icon on the original operation platform, and introduce the latest technology, show a higher performance and faster measurement speed.Its software intuitive workflow, make its operation process advanced technology of AFM easier than ever before.Dimension Icon用户无需像以前一样，通常需要几小时的专业参数调整，即可立即获得高质量的测量结果。Dimension Icon 的每个方面，从完全开放式针尖样品空间，到软件参数预设置，都经过特殊设计以求达到无障碍操作和惊人的AFM 易用性。
Flexible AFM platform
Dimension Icon showed excellent performance, stability and flexibility, almost can be realized only in a special system to complete all of the measurements.Using an open platform, large or diverse sample holder and the performance of many simple and easy to use, completely to the powerful features of the AFM show in front of the researchers in the field of scientific research and industry, AFM imaging and high quality to nano operation sets a new standard.
Dimension Icon to provide the performance does not have any effect the flexibility of the platform, a platform, infinite possibility:
- Open platform, which can integrate with other technologies
- Open the software and hardware, can easily customize your research applications - "if it does not exist, is invented it"
- Organic solar cells, such as the complete solution
application
Using AFM to expand your application
With a set of excellent AFM imaging mode, each study brooke help you provide the applicable technology of AFM.
Imaging model based on the core (contact mode and tapping mode), brooke provides a full set of AFM test mode, allowing users to detect samples of electrical, magnetic and other rich performance.Brooke original new peak force tapping technology as a new core imaging model, has been applied to a variety of measurement mode, can provide morphology, electrical and mechanical performance data at the same time.
Dimension Icon data sample
accessories
webinar
Recently the AFM webinars
User feedback
How do you say to customers
Brooke the size of the icon is on earth the most customizable and flexible AFM.Dimension icon to make crucial progress has been made in our laboratory, the development of surface voltage microscope and clarify at the core of solar fuel light tag charge transfer dynamics.Along the way, we can always rely on brooke advanced application team's great support.
Brooke icon AFM system installed in the two years ago in our clean room facilities, [where] have been revealed as a unique instrument, its capacity, with low noise and high resolution imaging of many users, in a variety of samples and reliable performance.ScanAsyst mode AFM probe will keep for several weeks in good condition, and to allow any student independence, and start measuring after short-term training.We are very satisfied!
Our size icon in the system of new multifunctional atomic force microscope reveals the nanoscale surface characteristics and terrain, such as adhesion and modulus and the scanning and peak force QMM.By combining the conduction of AFM and KPFM function, can observe the sink and equipment features at the same time, help us to understand the deformation and the state of the interface configuration file for more details.In addition, the high speed and reliability of the icon provides a quick process inspection and analysis.
