Atomic force microscope

Innova's atomic force microscope

The best choice of the AFM research started

Bright spot

innovation

Innova's®Atomic force microscope (AFM) volume is small, moderate cost, for scientific research provides rigorous and flexible solution.Its unique closed-loop scanning system to ensure that both the high testing precision, and can achieve comparable to those of the open loop test noise level.High resolution color light, open the sample stage and powerful experimental testing software made convenient time.Innova's致力于高分辨成像,在物理学、生命科学和材料科学等研究中发挥着重要作用。

accurate
High resolution imaging
Provides the omni-directional multi-angle precision measurement in different scales.
efficient
Optimizing the experimental process
Overview of rough surface, or arrangement of atoms, careful inquiry, innova's provide quick and easy solution.
strong
Custom experiment
In all test mode can be flexible configuration, signal provide infinite possibility.

The characteristics of

Characteristics of the

The new design

Innova's latest mechanical and electrical design adopted a shorter loop and ultra low noise electronic mechanical equipment, and to achieve the closed-loop precision positioning and high resolution.Ultra-low brooke special noise digital closed loop scanning, Innova's available in a variety of environments, such as air, liquid samples of different size characterization of all-round multi-angle.

Patented Top - Down to the optical system

Innova's optical zoom system is either directly controlled by the software, the resolution of 1 micron, able to directly observe the cantilever under different visual field and samples, to identify the detailed sample characteristics and probe for precise positioning.Optical device integration within the device and observe the samples at the same time, also improved the probe to replace with laser adjust convenience.After the user change the probe, just rotate the lens to the in situ, before focusing on the cantilever will always stay clear.

High-resolution morphology (orange) and phase (green) reveals the poly (styrene - styrene - butadiene - b - b) three block copolymer (SBS) in the micro phase separation.1 k x 1 k did not modify the original data.Image size: 2 microns.Closed-loop scanning.

Easily observed sample

Silicon DRAM scanning capacitance data of the battery.

Innova's convenient observation, the samples can be to open space provides more flexibility to customize experiments, for example, can be easily inserted electrodes for electrical and electrochemical characterization.

application

AFM mode

Using AFM to expand your application

With a set of excellent AFM imaging mode, each study brooke help you provide the applicable technology of AFM.

Imaging model based on the core (contact mode and tapping mode), brooke provides a full set of AFM test mode, allowing users to detect samples of electrical, magnetic and other rich performance.Brooke original new peak force tapping technology as a new core imaging model, has been applied to a variety of measurement mode, can provide morphology, electrical and mechanical performance data at the same time.

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User feedback

recommended

How do you say to customers

We are very pleased with brooke Innova's atomic force microscope.Its operation is convenient, the biophysical research and teaching are of great help.The students are happy to use this instrument, and on their own samples obtained very beautiful pictures.

Sam pull of the Indian institute of science and education, jose Mr Palmer dia, Dr, punjab, India's harry

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