XFlash 6 t - 60

For nm scale and under TEM analysis of large solid Angle of SDD
XFlash 6 t - 60 detectors

Install fine 60 mm diameter probe finger again2Medium effective area detection chip can provide larger solid horn and widely.Therefore, XFlash®6 t - 60 very suitable for the application of X-ray yield is relatively low, for example, energy spectrum analysis, with atomic resolution must keep zone axis and the sample can't tilt sensitive experiment and beam specimens (such as stoneInk, life science).The probe also provides a very good energy resolution, when Mn K alpha is 126 eV.

To sum up, XFlash®6 t - 60 has the following advantages:

  • Good energy resolution (Mn K alpha is 126 eV, alpha of 51 C K eV, alpha is 60 F K eV)
  • Other available resolution for Mn K alpha 129 eV
  • High pulse load capacity
  • Excellent light and low energy detection performance (Be - Am element range),
  • Welded bellows as standard
  • Simple, no vibration design of cooling system
  • Immediately after open the power supply is available
  • Low running cost
  • Maintenance free operation
  • Small size, including the fine diameter technology
  • Light weight
  • But should be required to provide no window version

XFlash 6 t - 60 application areas including:

  • TEM and STEM on the lower X-ray production application, including spherical aberration correction electron microscope