M1 MISTRAL

The key factors

• flexible
  
• Easy to operate
• User friendly touch screen interface
• Allow access to the raw data

M1 MISTRAL is a compact multi-functional desktop energy dispersive XRF spectrometer micro area.M1 MISTRAL is easy to operation, designed for use in industrial environment, economic and efficient operation quickly, provide relevant materials such as precious metal alloy element composition and coating thickness and multi-layer coating of accurate information.

B568 according to ASTM standard and European standard ISO 3497 on the block and coating is analyzed.By Rh target material to the chemical sedimentary phosphorus nickel plating (NIP) is analyzed, which can realize high precision.

All jewelry, silver alloy, platinum group metals or precision components can be identified in a minute.The results can be expressed as a percentage by weight or carat.

Analysis can be done without standard method or model based on the prototype, in order to achieve a higher precision.

From the location of sample to print in the report results - the whole working process can be implemented in the software.At the same time, through the open access to the raw data, ensure the data can be reproducibility.

Can without damaging the measuring elements.Without sample preparation.Even complex analysis tasks can be automated programmable XYZ stage, just click the mouse can begin.Super fast detection system provides rapid results.

M1 MISTRAL is equipped with large silicon drift detector (SDD), has excellent counting rate performance and energy resolution, detection limits can be reduced to the PPM level.High performance detector, digital pulse processing and optimization of the geometry can produce efficient X-ray detection, so as to rapidly and accurately obtain the results of the analysis.

M1 MISTRAL is easy to use and maintenance free design and powerful analysis software suite allows operation, even if only short trained personnel will be operating.No consumables or gas.Solid structure to ensure the stability of the highest and maintenance-free operation.

• Instrument control, data acquisition and management
• User optional touch screen interface
• Sample machine control and programming
• Metal multi-layer plating thickness analysis
• Quantitative composition analysis, top, and based on the experience of the standard model
• With functions of automatic peak identification line view
• Statistical process control (SPC) the trend line and data
• The report generator
• Results the archive