Dimension the HPI system specially designed for mass production, the environment, support for multiple AFM mode automation measurement, with a simple easy to use, and can realize in quality control, quality assurance and minimum detection cost in failure analysis.Dimension the HPI using contact, tapping technology and peak power tapping mode, enabling users to accurately control the probe and sample of interaction, so as to prolong the life of the probe, and keep the measurement in thousands of measurement accuracy.
innovation
Peak force tapping
Minimum transverse force that was over the heads of the geochemical exploration samples for protection, extend the life of the probe and most consistent measurement.
unique
A quick scan of AFM probe
Low cost measurement and ensure that the most reliable data.
Easy to use
Automation software
Make each user AFM experts, and ensure the consistency between the operator and the operator.
From the traditional pattern of AFM scanning to unique PeakForce peak force model, Dimension HPI provide flexible options, can meet various kinds of samples in a specific manufacturing engineering demand for measurement, and there is no general set of AFM is used to study the complexity of restrictions.
Rapid nano electric measurement
Rapid scanning technology and guide the power microscope (CAFM) combination can nanoscale current is measured under high scan rate, significantly improve the efficiency of failure analysis.FastScan HPI tapping mode the peak force and magnetic force microscopy, can be in does not affect the precision of magnetic force microscope case will scan speed increase 10 times.PeakForce KPFM ™ offers the highest spatial resolution and the most accurate surface potential measurement.PeakForceTUNA provide sensitive electrical conductivity measurement.
Accurate nano mechanical properties characterization
Brooke unique PeakForce QNM and FastForce Volume ™ model can accurately measure the mechanical properties of material - modulus, stiffness, adhesive, dissipation and form variables, imaging for the sample morphology and electrical properties.PeakForce QNM support for polymers, thin film and nanometer defects nondestructive measurement, the defects cannot be measured by TEM and SEM technology.
