Scanning electron microscopy (sem) coupled to nano mechanics test series

Hysitronπ89

功能强劲,精准和模块化的原位扫描电镜联用纳米力学测试系统

亮点

下一代原位纳米力学测试系统

Hysitron PI 89 scanning electron microscopy (sem) coupled to nano indentation apparatus

89年Hysitronπ扫描电镜联用纳米压痕仪利用扫描电子显微镜(SEM、FIB / SEM)的卓越成像能力,可以在成像的同时进行定量纳米力学测试。这套全新系统搭载力量领先的电容传感技术,继承了引领市场的第一批商业化原位SEM纳米力学平台的优良功能。该系统可实现包括纳米压痕、拉伸,微柱压缩,微球压缩,悬臂弯曲,断裂,疲劳,动态测试和力学性能成像等功能。

无以伦比
控制和性能
Has inherent displacement control, the displacement range from < 1 nm to 150 (including m, industry leading force range from < 1 (including N to 3.5 N, and the feedback rate of 78 KHZ and 39 KHZ rate of data acquisition, and recording all kinds of transient events.
创新
Sample machine technology
通过一个线性编码器和两种旋转/倾斜台配置实现可靠的和可重复的准确样品定位,性质成像,原位FIB加工和包括EBSD, EDS,疯牛病,跆拳道在内的分析成像。
multi-function
Modular design
支持几乎所有的原位测试技术和选项,包括高温,纳米摩擦,电表征,纳米动态力学,压转拉测试,直接拉伸,高应变率测试和扫描探针原位成像等。

The characteristics of

The characteristics of

Advanced performance and functionality

A new generation of design has two kinds of rotate/tilt the sample configuration.Additional linear collider samples between the sensor and the rapid and convenient location.

89年Hysitronπ的紧凑设计允许最大的样品台倾斜,以及测试时成像的最小工作距离.PI 89为研究者提供了比竞争产品更广阔的适用性和性能:

  • 重新设计的结构增加适用性和易用性
  • 1 nm accuracy under the linear encoder to achieve a greater range of the automatic test of better positioning repeatability
  • 更高的框架刚度(~ 0.9 x 106N/m) to provide better stability test process
  • Two kinds of rotate/tilt pattern implementation in the administration of urban and rural, FIB processing, and various kinds of detectors, including EDS, CBD, EBSD, and TKD, etc.

The inherent displacement control

好负载下降与SEM PicoIndenter true-displacement控制测试。速度限制bcc金属的变形机制在卷。Acta Materialia,卷166,2019年3月,p . 687 - 701年,2019年

Hysitron PI 89 using brooke advanced nanoscale sensors and pressure electric drive structure to achieve the real displacement control and load control test:

  • 在固有位移控制模式中,压电驱动器实现预设位移率的位移控制,同时力传感器测量力。
  • 在真载荷控制模式下,力传感器直接通过静电力加载,同时通过三板电容测量位移。
  • Minimize the temperature drift sensor of low current design extremely sensitive load and displacement measurement.

与SEM成像和其它性能成像同步的原位力学测试

从SEM获得的视频采集实现实时观察和与力学测试直接对应。样品由教授史蒂文•纳特大学(University of Southern California)惠赠。

Hysitron PI 89 obtained by in situ mechanical test results and SEM imaging synchronization and tied for display.This allows the user to observe defects, strain, thermal/electrical stimulation for engineering materials performance, longevity and durability from the scale of nanometers to microns.This synchronization to realize more analysis:

  • Rotate/tilt sample realization of EBSD and the combination of mechanical properties of imaging
  • 能在力学性能测试前、后直接进行FIB加工,而无需转换腔体

配件

Options and accessories

浏览我们表征技术的具体功能

The Hysitron PI 89 modular design support almost all of The in situ testing technology innovation.Two sets of samples of rotate/tilt table design for advanced imaging function and FIB processing.

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Our webinars cover best practices, and introduce new products, dojo.provide quick solutions to tricky questions, and offer ideas for new applications, modes or techniques.

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